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A low-noise latching comparator probe for waveform sampling applications

✍ Scribed by Bergman, D.I.; Waltrip, B.C.

Book ID: 114629376
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 349 KB
Volume: 52
Category: Article
ISSN: 0018-9456
DOI: 10.1109/tim.2003.815982

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