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A low-energy sims investigation of the analyzing depth by measuring diffusion coefficients using a nickel deposited copper single crystal

✍ Scribed by Hiroyuki Yamamoto; Tadashi Kikuchi; Keiichi Furuya


Book ID
118986921
Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
557 KB
Volume
177
Category
Article
ISSN
0039-6028

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