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A Load-Lock-Compatible Nanomanipulation System for Scanning Electron Microscope

โœ Scribed by Zhang, Yan Liang; Zhang, Yong; Ru, Changhai; Chen, Brandon K.; Sun, Yu


Book ID
118164912
Publisher
IEEE
Year
2013
Tongue
English
Weight
715 KB
Volume
18
Category
Article
ISSN
1083-4435

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In nanoprobing measurements the quality of the electrical contact strongly depends on the contact force. Probing semiconductors such as silicon requires applying very high and stable forces to establish an ohmic contact between the probe tip and the structure under study. Therefore, a compact force