𝔖 Bobbio Scriptorium
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A lifespan comparison of the reliability, test-retest stability, and signal-to-noise ratio of event-related potentials assessed during performance monitoring

✍ Scribed by Hämmerer, Dorothea; Li, Shu-Chen; Völkle, Manuel; Müller, Viktor; Lindenberger, Ulman


Book ID
119853369
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
530 KB
Volume
50
Category
Article
ISSN
0048-5772

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