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A least-squares approach to analyzing life-stress relationship in step-stress accelerated life tests

โœ Scribed by Siew-Leng Teng; Kwee-Poo Yeo


Book ID
114668121
Publisher
IEEE
Year
2002
Tongue
English
Weight
280 KB
Volume
51
Category
Article
ISSN
0018-9529

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A nonparametric approach to accelerated
โœ Karthik Devarajan; Nader Ebrahimi ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 235 KB ๐Ÿ‘ 2 views

Accelerated life testing (ALT) is concerned with subjecting items to a series of stresses at several levels higher than those experienced under normal conditions so as to obtain the lifetime distribution of items under normal levels. A parametric approach to this problem requires two assumptions. Fi