✦ LIBER ✦
A Layout Sensitivity Model for Estimating Electromigration-vulnerable Narrow Interconnects
✍ Scribed by Rani S. Ghaida; Payman Zarkesh-Ha
- Publisher
- Springer US
- Year
- 2008
- Tongue
- English
- Weight
- 586 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0923-8174
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