✦ LIBER ✦
A layer damage model for calculating thermal fatigue lifetime of power devices : Gao Guang-Bo, Chen An and Gui Xiang. 24 a. Proc. IEEE Reliab. Phys. Symp., 79 (1986)
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 131 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0026-2714
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