A lateral modulation technique for simultaneous friction and topography measurements with the atomic force microscope

✍ Scribed by Göddenhenrich, T.; Müller, S.; Heiden, C.

• Book ID: 120542415
• Publisher: American Institute of Physics
• Year: 1994
• Tongue: English
• Weight: 769 KB
• Volume: 65
• Category: Article
• ISSN: 0034-6748
• DOI: 10.1063/1.1144630