A Kolmogorov-Smirnov goodness-of-fit test for the two-parameter Weibull distribution when the parameters are estimated from the data : Major F. G. Parsons and P. H. Wirsching. Microelectron. Reliab.22 (2), 163 (1982)

• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 131 KB
• Volume: 23
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(83)91077-6