A knife-edge measurement of the beam profile of STXM 5.3.2.2 using a focussed ion beam milled metallic glass

✍ Scribed by Kerry B. Burke; Erik J. Luber; Natalie P. Holmes; Andrew J. Murray; Warwick J. Belcher; Xiaojing Zhou; David Mitlin; Paul C. Dastoor

• Book ID: 119235555
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 653 KB
• Volume: 185
• Category: Article
• ISSN: 0368-2048
• DOI: 10.1016/j.elspec.2012.07.003