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A Kelvin probe based method for measuring the electron emission yield of insulators and insulated conductors subjected to electron irradiation

✍ Scribed by Belhaj, M; Tondu, T; Inguimbert, V; Chardon, J P


Book ID
125804349
Publisher
Institute of Physics
Year
2009
Tongue
English
Weight
284 KB
Volume
42
Category
Article
ISSN
0022-3727

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