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A hydrogen-related defect with a mid-gap level in Si and a modified method to precisely determine the energy level near the mid-gap with deep level transient spectroscopy data

✍ Scribed by J. Wu; D.C. Peng; X.C. Yao; G.G. Qin


Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
385 KB
Volume
131
Category
Article
ISSN
0375-9601

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