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A holder for critical point drying of large numbers of EM-grids

✍ Scribed by N. Tommerup

Publisher: John Wiley and Sons
Year: 1992
Tongue: English
Weight: 212 KB
Volume: 23
Category: Article
ISSN: 1059-910X
DOI: 10.1002/jemt.1070230409

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✦ Synopsis

Introduction, In order to avoid surface tension damage, scanning electron microscopic specimens are often critical point dried (Anderson, 1951), a technique which involves

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