𝔖 Bobbio Scriptorium
✦   LIBER   ✦

A high sensitivity imaging detector for electron microscopy

✍ Scribed by A.R. Faruqi; H.N. Andrews; R. Henderson


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
447 KB
Volume
367
Category
Article
ISSN
0168-9002

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Position sensitive detectors for ion ele
✍ D. Bisello; A. Candelori; P. Giubilato; A. Kaminsky; S. Mattiazzo; M. Nigro; D. πŸ“‚ Article πŸ“… 2007 πŸ› Elsevier Science 🌐 English βš– 228 KB

At the INFN Legnaro Laboratories (Padova, Italy), an ion electron emission microscope dedicated to the study of radiation-induced damage in microelectronic devices has been recently installed. It is used to recognize, with micrometric resolution, the impact point of every single ion into the target.

Energy-filtered high-resolution electron
✍ Wang, Z. L. πŸ“‚ Article πŸ“… 1996 πŸ› John Wiley and Sons 🌐 English βš– 964 KB

Energy-filtered electron imaging is one of the future directions of high-resolution electron microscopy (HREM). In this paper, characteristics and applications of energy-selected HREM are illustrated. Image contrast can be dramatically improved with the use of an energy filter. High-resolution chemi

A position-sensitive detector for electr
✍ C.D. Moak; S. Datz; F.Garcia SantibÑñez; T.A. Carlson πŸ“‚ Article πŸ“… 1975 πŸ› Elsevier Science 🌐 English βš– 382 KB