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A high-resolution technique for strain measurement using an extrinsic Fabry–Perot interferometer (EFPI) and a compensating EFPI

✍ Scribed by Jiang, Yi; Tang, Caijie

Book ID: 123609953
Publisher: Institute of Physics
Year: 2008
Tongue: English
Weight: 667 KB
Volume: 19
Category: Article
ISSN: 0957-0233
DOI: 10.1088/0957-0233/19/6/065304

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