✦ LIBER ✦
A high-quality cross-sectional transmission electron microscope specimen preparation technique for structural and interfacial property studies in microelectronic packaging
✍ Scribed by M.R. Marks; Qin Wei; Wang Jiaji; Chen Yi
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 689 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0026-2714
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