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A high-pressure Raman spectroscopic study of hafnon, HfSiO4

โœ Scribed by Manoun, B.; Downs, R. T.; Saxena, S. K.

Book ID
121208560
Publisher
Mineralogical Society of America
Year
2006
Tongue
English
Weight
310 KB
Volume
91
Category
Article
ISSN
0003-004X

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A high-pressure Raman spectroscopic study of hafnon, HfSiO4
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Raman spectra of synthetic HfSiO 4 were determined to pressures of 38.2 GPa. Changes in the spectra indicate that HfSiO 4 undergoes a room-temperature phase transition from the hafnon structure (I4 1 /amd space group) to the scheelite structure (I4 1 /a space group) at a pressure of ~19.6 GPa. Upon

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