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A high-precision optical metrology system for determining the thickness of birefringent wave plates

✍ Scribed by Yen-Liang Yeh; Yen-Pin Lin; Kuang-Sheng Chen

Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 159 KB
Volume: 45
Category: Article
ISSN: 0143-8166
DOI: 10.1016/j.optlaseng.2007.06.001

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