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A high frequency sensor for optical beam deflection atomic force microscopy

✍ Scribed by Enning, Raoul; Ziegler, Dominik; Nievergelt, Adrian; Friedlos, Ralph; Venkataramani, Krithika; Stemmer, Andreas


Book ID
115471380
Publisher
American Institute of Physics
Year
2011
Tongue
English
Weight
639 KB
Volume
82
Category
Article
ISSN
0034-6748

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