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A high efficiency ion source for Kr and Xe isotopic measurements

✍ Scribed by J. Poths; E.P. Chamberlin

Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
585 KB
Volume
146-147
Category
Article
ISSN
0168-1176

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An electrostatic deflector has been designed and constructed that can be used in a reflecting time-of-flight mass spectrometer for either single-deflector or dual-deflector velocity selection in post-source decay measurements. The deflector consists of an interleaved set of parallel deflection elect