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A heuristic input control method for a single-product, high-volume wafer fabrication process to minimize the number of photomask changes


Publisher
Society of Manufacturing Engineers
Year
2004
Tongue
English
Weight
132 KB
Volume
23
Category
Article
ISSN
0278-6125

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✦ Synopsis


2003-2004 abstract and ke fword index

of dismantling and plastics recovery, the amount of shredder residue per vehicle will continue to rise.

This paper is an original work and has not been previously published except in the Transactions of NAMRI/