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A Heuristic approach to the generation of tests for faults on the intermediate lines : Ali Athar Khan, Harpreet Singh and N. K. Nanda. Comput. Electl Engng9 (2), 81 (1982)


Publisher
Elsevier Science
Year
1983
Tongue
English
Weight
127 KB
Volume
23
Category
Article
ISSN
0026-2714

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