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A graph based approach for reliability analysis of nano-scale VLSI logic circuits

✍ Scribed by Vaghef, Vahid Hamiyati; Peiravi, Ali

Book ID: 122309326
Publisher: Elsevier Science
Year: 2014
Tongue: English
Weight: 881 KB
Volume: 54
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2014.01.017

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