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A general program for interpreting electron diffraction patterns

✍ Scribed by Booth, M. ;Gittos, M. ;Wilkes, P.


Book ID
112808932
Publisher
Springer-Verlag
Year
1974
Weight
308 KB
Volume
5
Category
Article
ISSN
0026-086X

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Diffraction techniques are widely used especially as additional tools for analytical microprobe analysis. A supplementary device to a scanning electron microscope (SEM) allows taking of X-ray lattice source and wide angle interference patterns, now termed Kossel and Pseudo Kossel patterns, respectiv