✦ LIBER ✦
A general procedure for designing tests for LSI digital circuits : T. C. Chen, H. J. Gray, J. D. Wellin and B. Y. Woo. Microelectron. J.9, (4) 4 (1979)
- Publisher
- Elsevier Science
- Year
- 1979
- Tongue
- English
- Weight
- 133 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0026-2714
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