✦ LIBER ✦
A general noise and S-parameter deembedding procedure for on-wafer high-frequency noise measurements of MOSFETs
✍ Scribed by Chen, C.-H.; Deen, M.J.
- Book ID
- 111675712
- Publisher
- IEEE
- Year
- 2001
- Tongue
- English
- Weight
- 63 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0018-9480
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