✦ LIBER ✦
A general methodology using an electron beam tester applied to failure localization inside a logic integrated circuit
✍ Scribed by F. Marc; H. Frémont; P. Jounet; M. Barré; Y. Danto
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 750 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0167-9317
No coin nor oath required. For personal study only.