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A general control-volume formulation for modeling impact ionization in semiconductor transport

✍ Scribed by Laux, S.E.; Grossman, B.M.

Book ID: 114595299
Publisher: IEEE
Year: 1985
Tongue: English
Weight: 900 KB
Volume: 32
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1985.22241

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