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A general approach to compact threshold voltage formulation based on 2D numerical simulation and experimental correlation for deep-submicron ULSI technology development [CMOS]

✍ Scribed by Xing Zhou; Khee Yong Lim; Lim, D.


Book ID
114538012
Publisher
IEEE
Year
2000
Tongue
English
Weight
214 KB
Volume
47
Category
Article
ISSN
0018-9383

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