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A general approach for the performance assessment of nanoscale silicon FETs

✍ Scribed by Jing Wang; Solomon, P.M.; Lundstrom, M.


Book ID
114617543
Publisher
IEEE
Year
2004
Tongue
English
Weight
369 KB
Volume
51
Category
Article
ISSN
0018-9383

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## Abstract The exponential increase in expressed sequence tag (EST) sequence data amplifies the computational cost of clustering sequences such that new algorithms are required to analyze data at a greater rate. We have parallelized __d2\_cluster__ on a SGI Origin 2000 multiprocessor and observed