## Abstract A new measurement technique is presented to determine the complex permittivity of a dielectric material. The dielectric sample is loaded in a shortβcircuited rectangular waveguide. The reflection coefficient of the waveguide is measured by Network analyzer and calculated as a function o
β¦ LIBER β¦
A Frequency-Dependent LOD-FDTD Method and Its Application to the Analyses of Plasmonic Waveguide Devices
β Scribed by Shibayama, J.; Nomura, A.; Ando, R.; Yamauchi, J.; Nakano, H.
- Book ID
- 114565624
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 969 KB
- Volume
- 46
- Category
- Article
- ISSN
- 0018-9197
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