A focused-beam methodology for measuring microwave backscatter

✍ Scribed by John W. Schultz; Edward J. Hopkins; James G. Maloney; Eric J. Kuster; Morris P. Kesler

• Publisher: John Wiley and Sons
• Year: 2004
• Tongue: English
• Weight: 302 KB
• Volume: 42
• Category: Article
• ISSN: 0895-2477
• DOI: 10.1002/mop.20252

✦ Synopsis

Abstract

A methodology is developed to determine the microwave backscatter from inhomogeneous materials and structures using a free‐space focused‐beam apparatus. This quantitative method determines the scattering coefficient for inhomogeneous surfaces and echo width for linear discontinuities. Measured data from a random rough surface are compared to compact radar cross‐section (RCS) range measurements, scatter data from a periodic array are compared to numerical simulations, and edge‐diffraction measurements are compared to model calculations. © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 42: 201–205, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20252