A fault detection sensor for circuit aging using double-edge-triggered flip-flop

✍ Scribed by Luming Yan, Huaguo Liang, Zhengfeng Huang, Yanbin Liu

• Book ID: 118818070
• Publisher: SP Science Press
• Year: 2013
• Tongue: English
• Weight: 235 KB
• Volume: 30
• Category: Article
• ISSN: 0217-9822
• DOI: 10.1007/s11767-013-2126-2