A fast methodology to determine the characteristics of thousands of grains using three-dimensional X-ray diffraction. I. Overlapping diffraction peaks and parameters of the experimental setup

✍ Scribed by Sharma, Hemant ;Huizenga, Richard M. ;Offerman, S. Erik

• Book ID: 114497485
• Publisher: International Union of Crystallography
• Year: 2012
• Tongue: English
• Weight: 750 KB
• Volume: 45
• Category: Article
• ISSN: 0021-8898
• DOI: 10.1107/s0021889812025563