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A Fast and Accurate Method for Measuring Adjacent-Track Erasure

✍ Scribed by Guarisco, D.; Li, M.L.

Book ID: 114651656
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 780 KB
Volume: 42
Category: Article
ISSN: 0018-9464
DOI: 10.1109/tmag.2006.884786

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