A Method for Measuring the Thickness of
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P. Delavignette; R. W. Vook
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Article
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1963
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John Wiley and Sons
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English
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## Abstract A new method for measuring the thickness of thin monocrystalline foils in the range of 1000 Γ is presented. This method is based on the observation of KosselβMΓΆllenstedt fringes in transmission electron microscopy. It differs from the classical KosselβMΓΆllenstedt method in electron diff