A dynamic bias system for burn-in or thermal endurance treatments of 8085A microprocessors : R. N. Shaw. Microelectron. Reliab.22 (1), 117 (1982)

• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 124 KB
• Volume: 23
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(83)91046-6