๐”– Bobbio Scriptorium
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A dual-mode built-in self-test technique for capacitive MEMS devices

โœ Scribed by Xingguo Xiong; Yu-Liang Wu; Jone, W.-B.


Book ID
114630002
Publisher
IEEE
Year
2005
Tongue
English
Weight
411 KB
Volume
54
Category
Article
ISSN
0018-9456

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