✦ LIBER ✦
A DLTS and RBS analysis of the angular dependence of defects introduced in Si during ion beam channelling using 435 keV alphaparticles
✍ Scribed by P.N.K. Deenapanray; M.C. Ridgway; F.D. Auret; E. Friedland
- Book ID
- 114169785
- Publisher
- Elsevier Science
- Year
- 1998
- Tongue
- English
- Weight
- 467 KB
- Volume
- 136-138
- Category
- Article
- ISSN
- 0168-583X
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