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A direct measurement technique for small geometry MOS transistor capacitances

✍ Scribed by Weng, K.C.-K.; Yang, P.

Book ID: 120803467
Publisher: IEEE
Year: 1985
Tongue: English
Weight: 326 KB
Volume: 6
Category: Article
ISSN: 0741-3106
DOI: 10.1109/EDL.1985.26035

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