𝔖 Bobbio Scriptorium
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A direct comparison between three different methods of measuring the minority carrier lifetime in thin silicon slices†

✍ Scribed by BASSETT, R. J.; HOGARTH, C. A.


Book ID
126835781
Publisher
Taylor and Francis Group
Year
1968
Tongue
English
Weight
214 KB
Volume
25
Category
Article
ISSN
0020-7217

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