𝔖 Bobbio Scriptorium
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A digital signal-processing analysis technique for the infrared reflectivity characterization of ion implanted silicon

✍ Scribed by Gustavo E. Aizenberg; Pieter L. Swart; Beatrys M. Lacquet


Book ID
112819939
Publisher
Springer US
Year
1992
Tongue
English
Weight
650 KB
Volume
21
Category
Article
ISSN
0361-5235

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