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A Diffusion Analysis Approach to TE Mode Propagation in Randomly Perturbed Optical Waveguides

✍ Scribed by Perrey-Debain, Emmanuel; Abrahams, I. David

Book ID
118194063
Publisher
Society for Industrial and Applied Mathematics
Year
2007
Tongue
English
Weight
358 KB
Volume
68
Category
Article
ISSN
0036-1399

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## Abstract We report on the first near‐field observation of light propagation in a porous silicon planar waveguide. The observation has been made possible using a scattering‐type scanning near field optical microscope (s‐SNOM). Optical constants of the propating modes are retrieved by two methods