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A device model for an ion-implanted MESFET with Half-Pearson and Half-Gaussian distribution under post-anneal conditions

✍ Scribed by Haldar, S.; Maneesha; Khanna, M.K.; Gupta, R.S.


Book ID
114535885
Publisher
IEEE
Year
1994
Tongue
English
Weight
350 KB
Volume
41
Category
Article
ISSN
0018-9383

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