Introduction. The preparation of non-conductive, hard, composite, or multiphase materials for observation in the transmission electron microscope often requires mechanical pre-thinning prior to ion-beam milling. Such pre-thinning of samples to the 10-30~m regime results in a reduction in the deleter
โฆ LIBER โฆ
A device for the preparation of composite crystal samples
โ Scribed by E. Legrand; S. Hautecler; L. Vansteelandt
- Publisher
- Elsevier Science
- Year
- 1974
- Weight
- 186 KB
- Volume
- 120
- Category
- Article
- ISSN
- 0029-554X
No coin nor oath required. For personal study only.
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Electrodepositions were carried out by application of recurrent potential scans from solutions containing M substrate and lo-' M TBHP in either CHsCN or CH2C12. Films for optical characterization were deposited on indium-tin oxide transparent electrodes. After electrodeposition, the films were trans