A demonstration of the effectiveness of a single aberration correction per optical slice in beam scanned optically sectioning microscopes

✍ Scribed by Simon P. Poland; Amanda J. Wright; Stuart Cobb; Jacob C. Vijverberg; John M. Girkin

• Book ID: 108210426
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 591 KB
• Volume: 42
• Category: Article
• ISSN: 0968-4328
• DOI: 10.1016/j.micron.2010.05.018