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A delay metric for RC circuits based on the Weibull distribution

โœ Scribed by Liu, F.; Kashyap, C.; Alpert, C.J.

Book ID
117907112
Publisher
IEEE
Year
2004
Tongue
English
Weight
211 KB
Volume
23
Category
Article
ISSN
0278-0070

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[ACM Press the 2002 IEEE/ACM internation
[ACM Press the 2002 IEEE/ACM international conference - San Jose, California (2002.11.10-2002.11.14)] Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design - ICCAD '02 - A delay metric for RC circuits based on the Weibull distribution
โœ Liu, Frank; Kashyap, Chandramouli; Alpert, Charles J. ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› ACM Press ๐ŸŒ English โš– 112 KB

Sponsored By Ieee Circuits And Systems Society ... [et Al.]. Celebrating 20 Years Of Excellence. Ieee Catalog Number: 02ch37391 ; Acm Order Number 477023--t.p. Verso. Includes Bibliographical References And Author Index. Also Available On The World Wide Web Via Acm Digital Library With Title: Procee