✦ LIBER ✦
A Degradation Model of Double Gate and Gate-All-Around MOSFETs With Interface Trapped Charges Including Effects of Channel Mobile Charge Carriers
- Book ID
- 127103877
- Publisher
- IEEE
- Year
- 2014
- Tongue
- English
- Weight
- 533 KB
- Volume
- 14
- Category
- Article
- ISSN
- 1530-4388
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