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A deep-level spectroscopic technique for determining capture cross-section activation energy of Si-related DX centers in AlxGa1−xAs

✍ Scribed by Ghosh, Subhasis; Kumar, Vikram


Book ID
121475257
Publisher
American Institute of Physics
Year
1994
Tongue
English
Weight
544 KB
Volume
75
Category
Article
ISSN
0021-8979

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