A DC potential method for measuring sizes of semielliptical cracks: Ohji, K., Kubo, S., Sakagami, T., Yasuda, S. and Fujishita, K.-I. J. Soc. Mater. Sci., Japan Aug. 1990 39, 1167–1172 (in Japanese)

A.D.C. potential method for measuring si

A.D.C. potential method for measuring sizes of semi-elliptical surface cracks (In Japanese: English abstract) : 45249 Ohji, K.; Kubo, S.; Sakagani, T.; Yasuda, S. Fuhjishima, K.-I. Journal of the Society of Materials Science, Japan, Vol. 39, No. 443, pp. 1167–1172 (Aug. 1990)

📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 121 KB

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